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Browsing by Author Jin, Hao

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Showing results 2 to 21 of 35

Characterisation of the Si-SiO2 Interface after humidity exposure

Author(s)Johnson, Luke; McIntosh, Keith; Richards, Bryce, et al
TypeConference paper
Date Published2006
Date CreatedSeptember 13-15 2006

Characterization of low pressure chemical vapour deposited Si3N4 films

Author(s)Jin, Hao; Weber, Klaus; Blakers, Andrew
TypeConference paper
Date Published2006
Date CreatedSeptember 13-15 2006

Characterization of the Si-SiO 2 Interface Following Room Temperature Ammonia Plasma Exposure

Author(s)Jin, Hao; Weber, Klaus; Smith, Paul
TypeJournal article
Date Published2007
Date Created-
01_Jin_Comparison_of_plasma_NH3_and_2006.pdf.jpg

Comparison of plasma NH3 and atomic H effects to Si-SiO2 interface

Author(s)Jin, Hao; Weber, Klaus; Jayaprasad, A, et al
TypeConference paper
Date Published2006
Date CreatedJune 25-30, 2006
01_Jin_Comparison_of_the_thermal_2006.pdf.jpg

Comparison of the thermal stabilityof thermally grown silicon dioxide on silicon before and after LPCVD deposition

Author(s)Jin, Hao; Zellweger, Hans; Weber, Klaus, et al
TypeConference paper
Date Published2006
Date CreatedSeptember 13-15 2006
01_Jin_Defect_generation_at_SiO₂/Si_2006.pdf.jpg

Defect generation at SiO₂/Si interfaces by low pressure chemical vapor deposition of silicon nitride

Author(s)Jin, Hao; Weber, K. J.; Smith, P. J.
TypeJournal article
Date Published1-Sep-2006
Date Created-
01_Jin_Defect_generation_at_the_2007.pdf.jpg

Defect generation at the Si–SiO₂ interface following corona charging

Author(s)Jin, Hao; Weber, K. J.; Dang, N. C., et al
TypeJournal article
Date Published28-Jun-2007
Date Created-

Defect generation concomitant with plasma nitridation to Si/SiO2 stacks at room temperature

Author(s)Jin, Hao; Weber, Klaus; Smith, Paul, et al
TypeConference paper
Date Published2006
Date CreatedSeptember 13-15 2006
01_Jin_Depassivation_of_Si-SiO2_2006.pdf.jpg

Depassivation of Si-SiO2 interface following rapid thermal annealing

Author(s)Jin, Hao; Weber, Klaus; Blakers, Andrew
TypeConference paper
Date Published2006
Date CreatedMay 8-12 2006

Effect of atomic H exposure on thermally oxidized Si/Si02 interfaces

Author(s)Zhang, Chun; Weber, Klaus; Jin, Hao
TypeConference paper
Date Published2009
Date CreatedSeptember 21-24 2009

Effect of diffusions on Si surface passivation

Author(s)Jin, Hao; Jellett, Wendy; Zhang, Chun, et al
TypeConference paper
Date Published2008
Date CreatedSeptember 1-4 2008

Effect of Phosphorus Diffusion to the Recombination at the Si-SiO2 Interface

Author(s)Jin, Hao; Weber, Klaus; Zhang, Chun
TypeJournal article
Date Published2009
Date Created-

Hydrogen introduction by acid solution to Si/Si02 interface

Author(s)Zhang, Chun; Jin, Hao; Jellett, Wendy, et al
TypeConference paper
Date Published2008
Date CreatedSeptember 1-4 2008

Hydrogen Passivation of LPCVD Si3N4/SiO2/Si Stacks by Ammonia Plasma Treatment

Author(s)Jin, Hao; Weber, Klaus; Blakers, Andrew
TypeJournal article
Date Published2007
Date Created-

Hydrogen reintroduction by forming gas annealing to LPCVD silicon nitride coated structures

Author(s)Jin, Hao; Weber, Klaus; Deenapanray, Prakash, et al
TypeJournal article
Date Published2006
Date Created-

Influence of boron diffusion on the Si Surface passivation

Author(s)Jellett, Wendy; Weber, Klaus; Jin, Hao
TypeConference paper
Date Published2007
Date CreatedSeptember 3-7 2007

Influence of Phosphorous Diffusion on the Si Surface Passivation

Author(s)Jin, Hao; Weber, Klaus; Jellett, Wendy, et al
TypeConference paper
Date Published2007
Date CreatedSeptember 3-7 2007

Introduction of atomic hydrogen into Si 3 N 4 /SiO 2 /Si stacks

Author(s)Jin, Hao; Weber, Klaus; Li, Wei, et al
TypeJournal article
Date Published2006
Date Created-

Introduction of Negative Charges in Nitride for PV Applications

Author(s)Jin, Hao; Weber, Klaus; Paudyal, Bijaya, et al
TypeConference paper
Date Published2009
Date CreatedJune 7-12 2009

Investigation of interface properties in oxide passivated boron diffused silicon

Author(s)Nursam, Natalita; Weber, Klaus; Jin, Hao, et al
TypeJournal article
Date Published2010
Date Created-

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