Browsing by Author Jin, Hao
Showing results 22 to 35 of 35
Low SI surface recombination through negatively charged Si3N4 films
Author(s) | Jin, Hao; Weber, Klaus; Zhang, Chun, et al |
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Type | Conference paper |
Date Published | 2009 |
Date Created | September 21-24 2009 |
Passivation and depassivation of Si-SiO 2 interfaces with atomic hydrogen
Author(s) | Zhang, Chun; Weber, Klaus; Jin, Hao |
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Type | Journal article |
Date Published | 2009 |
Date Created | - |
Passivation of LPCVD nitride silicon stacks by atomic H
Author(s) | Jin, Hao; Weber, Klaus; Blakers, Andrew |
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Type | Conference paper |
Date Published | 2006 |
Date Created | May 8-12 2006 |
Plasma ammonia passivation of SiN/SiO2/Si stacks
Author(s) | Jin, Hao; Weber, Klaus; Blakers, Andrew |
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Type | Conference paper |
Date Published | 2006 |
Date Created | June 25-30, 2006 |
Relationship between interface defect density and surface recombination velocity in (111) and (100) Silicon / Silicon Oxide structure
Author(s) | Jin, Hao; Weber, Klaus |
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Type | Conference paper |
Date Published | 2008 |
Date Created | September 1-4 2008 |
Si-SiO2 interface passivation by plasma NH3 and atomic H
Author(s) | Jin, Hao; Weber, Klaus; Jayaprasad, A, et al |
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Type | Journal article |
Date Published | 2006 |
Date Created | - |
Silicon / Silicon oxide / LPCVD Silicon nitride stacks: The effect of oxide thickness on bulk damage and surface passivation
Author(s) | Jin, Hao; Weber, K. J; Blakers, Andrew |
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Type | Conference paper |
Date Published | - |
Date Created | 2005 |
Silicon/silicon oxide/LPCVD silicon nitride stacks: the effect of oxide thicknoww on bulk damage and surface passivation
Author(s) | Jin, Hao; Weber, Klaus; Blakers, Andrew |
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Type | Conference paper |
Date Published | 2005 |
Date Created | June 6 2005 |
SLIVER Solar Cells
Author(s) | Jin, Hao; Weber, Klaus; Deenapanray, Prakash, et al |
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Type | Conference paper |
Date Published | 2005 |
Date Created | October 10 2005 |
Surface passivation using dielectric films: How much charge is enough?
Author(s) | Weber, Klaus; Jin, Hao; Zhang, Chun, et al |
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Type | Conference paper |
Date Published | 2009 |
Date Created | September 21-24 2009 |
The effect of a post oxidation in-situ nitrogen anneal on Si surface passivation
Author(s) | Jin, Hao; Weber, Klaus; Blakers, Andrew |
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Type | Conference paper |
Date Published | 2006 |
Date Created | May 8-12 2006 |
The effect of exposure of Si-Si02 structure to atomic H by PECVD reactor
Author(s) | Zhang, Chun; Weber, Klaus; Jin, Hao, et al |
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Type | Conference paper |
Date Published | 2009 |
Date Created | June 7-12 2009 |
The effect of LPCVD silicon nitride deposition on the Si-SiO2 interface of oxidised silicon wafers
Author(s) | Jin, Hao; Weber, Klaus |
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Type | Journal article |
Date Published | 2007 |
Date Created | - |
The influence of corona charging on the Si/Si02 interface
Author(s) | Zhang, Chun; Jin, Hao; Jellett, Wendy, et al |
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Type | Conference paper |
Date Published | 2008 |
Date Created | September 1-4 2008 |
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