Relationship between interface defect density and surface recombination velocity in (111) and (100) Silicon / Silicon Oxide structure
Collections | ANU Research Publications |
---|---|
Date published: | 2008 |
Type: | Conference paper |
URI: | http://hdl.handle.net/1885/33493 |
Source: | Proceedings of the European Photovoltaic Solar Energy Conference 2008 |
Download
File | Description | Size | Format | Image |
---|---|---|---|---|
01_Jin_Relationship_between_interface_2008.pdf | 414.3 kB | Adobe PDF | Request a copy |
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.
Updated: 20 July 2017/ Responsible Officer: University Librarian/ Page Contact: Library Systems & Web Coordinator