Skip navigation
Skip navigation

Relationship between interface defect density and surface recombination velocity in (111) and (100) Silicon / Silicon Oxide structure

CollectionsANU Research Publications
Date published: 2008
Type: Conference paper
URI: http://hdl.handle.net/1885/33493
Source: Proceedings of the European Photovoltaic Solar Energy Conference 2008

Download

File Description SizeFormat Image
01_Jin_Relationship_between_interface_2008.pdf414.3 kBAdobe PDF    Request a copy


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator