Browsing by Author Rougieux, F. E.
Showing results 1 to 8 of 8
Boron-oxygen defect imaging in p-type Czochralski silicon
Author(s) | Lim, S. Y.; Rougieux, F. E.; Macdonald, D. |
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Type | Journal article |
Date Published | 27-Aug-2013 |
Date Created | - |
Boron-oxygen defect in Czochralski-silicon co-doped with gallium and boron
Author(s) | Forster, M.; Fourmond, E.; Rougieux, F. E., et al |
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Type | Journal article |
Date Published | 27-Jan-2012 |
Date Created | - |
Electron and hole mobility reduction and Hall factor in phosphorus-compensated p-type silicon
Author(s) | Rougieux, F. E.; Macdonald, D.; Cuevas, A., et al |
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Type | Journal article |
Date Published | 7-Jul-2010 |
Date Created | - |
Grown-in defects limiting the bulk lifetime of p-type float-zone silicon wafers
Author(s) | Grant, N. E.; Rougieux, F. E.; Macdonald, D., et al |
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Type | Journal article |
Date Published | 6-Feb-2015 |
Date Created | - |
Impact of incomplete ionization of dopants on the electrical properties of compensated p-type silicon
Author(s) | Forster, M.; Cuevas, A.; Fourmond, E., et al |
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Type | Journal article |
Date Published | 17-Feb-2012 |
Date Created | - |
Influence of net doping, excess carrier density and annealing on the boron oxygen related defect density in compensated n-type silicon
Author(s) | Rougieux, F. E.; Lim, B.; Schmidt, J., et al |
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Type | Journal article |
Date Published | 2011 |
Date Created | - |
Reading data stored in the state of metastable defects in silicon using band-band photoluminescence: Proof of concept and physical limits to the data storage density
Author(s) | Rougieux, F. E.; Macdonald, D. |
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Type | Journal article |
Date Published | 28-Mar-2014 |
Date Created | - |
Upgraded metallurgical-grade silicon solar cells with efficiency above 20%
Author(s) | Zheng, P.; Rougieux, F. E.; Samundsett, C., et al |
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Type | Journal article |
Date Published | 22-Mar-2016 |
Date Created | - |
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