Structural Changes in Ultra-High-Dose Self-Implanted Crystalline and Amorphous Silicon
| dc.contributor.author | Zhu, Xiaohua | |
| dc.contributor.author | Williams, James | |
| dc.contributor.author | McCallum, J. | |
| dc.date.accessioned | 2015-12-13T23:34:19Z | |
| dc.date.issued | 1999 | |
| dc.date.updated | 2015-12-12T09:35:34Z | |
| dc.description.abstract | Ultra-high-dose Si ion implantation (1×1018 cm-2) into both amorphous and crystalline Si has been studied as a function of implantation temperature from liquid nitrogen to 250°C. The samples were analysed before and after 600°C annealing by Rutherford | |
| dc.identifier.issn | 0168-583X | |
| dc.identifier.uri | http://hdl.handle.net/1885/93410 | |
| dc.publisher | Elsevier | |
| dc.source | Nuclear Instruments and Methods in Physics Research: Section B | |
| dc.subject | Keywords: Cross-sectional transmission electron microscopy (XTEM); Amorphous films; Amorphous silicon; Crystal defects; Crystalline materials; Crystallization; Epitaxial growth; High temperature effects; Ion bombardment; Ion implantation; Radiation damage; Reaction Amorphous and crystalline silicon; Complex crystal defect; High dose self-implantation; Regrowth | |
| dc.title | Structural Changes in Ultra-High-Dose Self-Implanted Crystalline and Amorphous Silicon | |
| dc.type | Journal article | |
| local.bibliographicCitation.lastpage | 272 | |
| local.bibliographicCitation.startpage | 268 | |
| local.contributor.affiliation | Zhu, Xiaohua, College of Physical and Mathematical Sciences, ANU | |
| local.contributor.affiliation | Williams, James, College of Physical and Mathematical Sciences, ANU | |
| local.contributor.affiliation | McCallum, J, College of Physical and Mathematical Sciences, ANU | |
| local.contributor.authoruid | Zhu, Xiaohua, u4046809 | |
| local.contributor.authoruid | Williams, James, u8809701 | |
| local.contributor.authoruid | McCallum, J, u9902178 | |
| local.description.embargo | 2037-12-31 | |
| local.description.notes | Imported from ARIES | |
| local.description.refereed | Yes | |
| local.identifier.absfor | 020203 - Particle Physics | |
| local.identifier.ariespublication | MigratedxPub24752 | |
| local.identifier.citationvolume | 148 | |
| local.identifier.scopusID | 2-s2.0-0033513654 | |
| local.type.status | Published Version |
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