Thermally-assisted Ti/Pr0.7Ca0.3MnO3 ReRAM with excellent switching speed and retention characteristics

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Authors

Jung, Seungjae
Siddik, Manzar
Lee, Wootae
Park, Jubong
Liu, Xinjun
Woo, Jiyong
Choi, Godeuni
Lee, Joonmyoung
Lee, Nodo
Jang, Yun Hee

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IEEE

Abstract

We proposed for the first time thermally-assisted resistive switching random access memory (ReRAM) device to overcome the voltage-time dilemma [1] using Ti/Pr0.7Ca0.3MnO3 (Ti/PCMO) with Ge2Sb2Te5 (GST) thermoelectric heater as well as thermal barrier (Fig. 1). "Thermoelectric heating effect" from GST/Ti junction [2] and "thermal barrier effect" from the heat confinement by GST and PCMO thermal insulators [3,4] successfully improved switching speed while "large effective Schottky barrier (SB) height (Φeff) " provided excellent robustness to high-temperature retention and read/set/reset disturbance characteristics (Fig. 2).

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Technical Digest - International Electron Devices Meeting, IEDM

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2037-12-31