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Terahertz Emission and Lifetime Measurements of Ion-implanted Semiconductors: Experiment and Simulation

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dc.contributor.authorLloyd-Hughes, Jen_AU
dc.contributor.authorCastro-Camus, Een_AU
dc.contributor.authorFraser, Michaelen_AU
dc.contributor.authorJagadish, Chennupatien_AU
dc.contributor.authorJohnston, Michael Ben_AU
dc.contributor.authorTan, Hark Hoeen_AU
dc.coverage.spatialLong Beach USA
dc.date.accessioned2015-12-07T22:25:13Z
dc.date.createdMay 21-26 2006
dc.date.issued2006
dc.date.updated2016-02-24T11:40:41Z
dc.description.abstractThe spectral width of terahertz emission from ion-implanted terahertz emitters increases with ion damage, owing to ultrafast carrier capture. Carrier dynamics simulations reinforce these findings. Optical-pump, terahertz-probe experiments confirm the subpicosecond lifetimes of these materials.
dc.identifier.isbn1557528136
dc.identifier.urihttp://hdl.handle.net/1885/21162
dc.publisherOptical Society of America
dc.relation.ispartofseriesConference on Lasers and Electro-Optics, Quantum Electronics and Laser Science/Conference on Photonic Applications, Systems and Technologies (CLEO/QELS 2006)
dc.sourceConference on Lasers and Electro-Optics Quantum Electronics and Laser Science: Conference on Photonic Applications, Systems and Technologies: Technical Digest CD-ROM
dc.subjectKeywords: Civil aviation; Electron optics; Ions; Lasers; Optical pumping; Quantum electronics; Carrier dynamics; Ion damages; Life-times; Lifetime measurements; Optical-; Semi-conductors; Spectral widths; Subpicosecond; Terahertz; Terahertz emissions; Terahertz emi
dc.titleTerahertz Emission and Lifetime Measurements of Ion-implanted Semiconductors: Experiment and Simulation
dc.typeConference paper
local.bibliographicCitation.startpageJTuD18-1-2
local.contributor.affiliationLloyd-Hughes, J, University of Oxford
local.contributor.affiliationCastro-Camus, E, University of Oxford
local.contributor.affiliationFraser, Michael, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationTan, Hoe Hark, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationJagadish, Chennupati, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationJohnston, Michael B, University of Oxford
local.contributor.authoruidFraser, Michael, u2524674
local.contributor.authoruidTan, Hoe Hark, u9302338
local.contributor.authoruidJagadish, Chennupati, u9212349
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor100799 - Nanotechnology not elsewhere classified
local.identifier.absfor020501 - Classical and Physical Optics
local.identifier.ariespublicationu8606713xPUB15
local.identifier.doi10.1109/CLEO.2006.4628606
local.identifier.scopusID2-s2.0-55649104982
local.type.statusPublished Version

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