Lanthanum distribution and dielectric properties of intergrowth Bi₅ˍₓLaₓTiNbWO₁₅ ferroelectrics

Date

2005-11-08

Authors

Yi, Z. G.
Li, Y. X.
Zeng, J. T.
Yang, Q. B.
Wang, D.
Lu, Y. Q.
Yin, Q. R.

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Volume Title

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American Institute of Physics (AIP)

Abstract

Bi₅ˍₓLaₓTiNbWO₁₅ (x=0–1.50)ceramics prepared by conventional solid-state reaction were studied using x-ray diffraction(XRD),dielectric spectroscopy and Raman scattering techniques. The XRD analysis implied that single-phase intergrowth bismuth layered perovskite structure was obtained for all the samples and when x=0.75, the Bi³⁺ in (Bi₂O₂)²⁺ layer begins to be substituted by La³⁺. The dielectric spectra showed that, when Bi³⁺ in (Bi₂O₂)²⁺ is substituted, the Curie temperature becomes diffusive and the dielectricpermittivity at room temperature is increased in a wide frequency range. Especially when x=1.50, the dielectricpermittivity reaches its maximum of 270, nearly two times larger than that of the La3+ undoped sample. The Raman scattering experiments evidenced further that Bi³⁺ in (Bi₂O₂)²⁺ is substituted when x⩾0.75 and revealed the orthorhombic distortion of the octahedra is responsible for the increase of the dielectricpermittivity at x⩾1.25.

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Source

Applied Physics Letters

Type

Journal article

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DOI

10.1063/1.2132077

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