Exposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM technique

dc.contributor.authorGibson, Bradley K
dc.contributor.authorHuntington, Shane T
dc.contributor.authorRubanov, S
dc.contributor.authorOlivero, P
dc.contributor.authorDigweed-Lyytikainen, K
dc.contributor.authorCanning, J
dc.contributor.authorLove, John
dc.date.accessioned2009-06-01T02:48:26Zen_US
dc.date.accessioned2010-12-20T06:05:32Z
dc.date.available2009-06-01T02:48:26Zen_US
dc.date.available2010-12-20T06:05:32Z
dc.date.issued2005-10-31en_US
dc.date.updated2015-12-12T07:20:17Z
dc.description.abstractThis paper presents a technique to expose and characterize nano-structured hole arrays in tapered photonic crystal fibers. Hole array structures are examined with taper outer diameters ranging from 12.9 μm to 1.6 μm. A combined focused ion beam milling and scanning electron microscope system was used to expose and characterize the arrayed air-silica structures. Results from this combined technique are presented which resolve hole-to-hole pitch sizes and hole diameters in the order of 120 nm and 60 nm, respectively.
dc.format6 pages
dc.identifier.citationOptics Express 13.22 (2005): 9023-9028
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://hdl.handle.net/10440/355en_US
dc.identifier.urihttp://digitalcollections.anu.edu.au/handle/10440/355
dc.publisherOptical Society of America
dc.rights"OSA will grant the authors permission to deposit the publisher’s pdf from their Optics Express articles into the repository with the proper citation (reference number or journal /volume/page/year citation)." - from email received from Authorized Agent, The Optical Society, 27/05/10
dc.sourceOptics Express
dc.source.urihttp://www.opticsinfobase.org/DirectPDFAccess/99A68CFA-BDB9-137E-C3D2F52CBE563A8E_86070.pdf?da=1&id=86070&seq=0&CFID=39997365&CFTOKEN=32868506en_US
dc.subjectfiber optics
dc.subjectlasers, carbon dioxide
dc.subjectfiber characterization
dc.subjectfiber optics imaging
dc.subjectscanning microscopy
dc.titleExposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM technique
dc.typeJournal article
dcterms.dateAccepted2005-10-22en_US
local.bibliographicCitation.issue22
local.bibliographicCitation.lastpage9028
local.bibliographicCitation.startpage9023
local.contributor.affiliationGibson, Bradley K, University of Central Lancashireen_US
local.contributor.affiliationHuntington, Shane T, University of Melbourneen_US
local.contributor.affiliationRubanov, S, University of Melbourneen_US
local.contributor.affiliationOlivero, P, University of Melbourneen_US
local.contributor.affiliationDigweed-Lyytikainen, K, University of Sydneyen_US
local.contributor.affiliationCanning, J, University of Sydneyen_US
local.contributor.affiliationLove, John, Research School of Physical Sciences and Engineering, Department of Theoretical Physicsen_US
local.contributor.authoruidE3097en_US
local.contributor.authoruidE10817en_US
local.contributor.authoruidE16855en_US
local.contributor.authoruidE14986en_US
local.contributor.authoruidE7907en_US
local.contributor.authoruidE2114en_US
local.contributor.authoruidu7501719en_US
local.description.notesArticle written under name Gibson, Bradley C.en_US
local.description.refereedYes
local.identifier.absfor020501en_US
local.identifier.ariespublicationMigratedxPub11454en_US
local.identifier.citationvolume13
local.identifier.doi10.1364/OPEX.13.009023
local.identifier.scopusID2-s2.0-27544465828
local.identifier.uidSubmittedByu8402810en_US
local.type.statusPublished Versionen_US

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