Exposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM technique
Date
2005-10-31
Authors
Gibson, Bradley K
Huntington, Shane T
Rubanov, S
Olivero, P
Digweed-Lyytikainen, K
Canning, J
Love, John
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Volume Title
Publisher
Optical Society of America
Abstract
This paper presents a technique to expose and characterize
nano-structured hole arrays in tapered photonic crystal fibers. Hole array
structures are examined with taper outer diameters ranging from 12.9 μm
to 1.6 μm. A combined focused ion beam milling and scanning electron
microscope system was used to expose and characterize the arrayed
air-silica structures. Results from this combined technique are presented
which resolve hole-to-hole pitch sizes and hole diameters in the order of
120 nm and 60 nm, respectively.
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Keywords
fiber optics, lasers, carbon dioxide, fiber characterization, fiber optics imaging, scanning microscopy
Citation
Optics Express 13.22 (2005): 9023-9028
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Source
Optics Express
Type
Journal article
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