Visualization of the internal structure of orientation-patterned III-V semiconductors
Date
2015
Authors
Karpinski, Pawel
Chen, Xin
Shvedov, Vladlen
Hnatovsky, Kyrylo (Cyril)
Grisard, Arnaud
Lallier, Eric
Luther-Davies, Barry
Sheng, Yan
Krolikowski, Wieslaw
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Abstract
We investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientationpatterned semiconductor.
Description
Keywords
Citation
Collections
Source
Type
Conference paper
Book Title
Entity type
Access Statement
License Rights
Restricted until
2037-12-31