Visualization of the internal structure of orientation-patterned III-V semiconductors

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dc.contributor.authorKarpinski, Pawelen_AU
dc.contributor.authorChen, Xinen_AU
dc.contributor.authorShvedov, Vladlenen_AU
dc.contributor.authorHnatovsky, Kyrylo (Cyril)en_AU
dc.contributor.authorGrisard, Arnauden_AU
dc.contributor.authorLallier, Ericen_AU
dc.contributor.authorLuther-Davies, Barryen_AU
dc.contributor.authorSheng, Yanen_AU
dc.contributor.authorKrolikowski, Wieslawen_AU
dc.coverage.spatialSan Jose, CA
dc.date.accessioned2016-06-14T23:18:56Z
dc.date.created10-15 May 2015
dc.date.issued2015
dc.date.updated2016-06-14T08:30:44Z
dc.description.abstractWe investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientationpatterned semiconductor.
dc.identifier.isbn15365627
dc.identifier.urihttp://hdl.handle.net/1885/102677
dc.publisherIEEE
dc.relation.ispartofseriesCLEO 2015: Lasers and Electro-Optics
dc.source.urihttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7183976&openedRefinements%3D*%26filter%3DAND%28NOT%284283010803%29%29%26pageNumber%3D7%26rowsPerPage%3D100%26queryText%3D%28diffraction+light+%29
dc.titleVisualization of the internal structure of orientation-patterned III-V semiconductors
dc.typeConference paper
local.bibliographicCitation.startpage2267-
local.contributor.affiliationKarpinski, Pawel, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationChen, Xin, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationShvedov, Vladlen, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationHnatovsky, Kyrylo (Cyril), College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationGrisard, Arnaud, Thales Research and Technology
local.contributor.affiliationLallier, Eric, Thales Research and Technology
local.contributor.affiliationLuther-Davies, Barry, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKrolikowski, Wieslaw, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationSheng, Yan, College of Physical and Mathematical Sciences, ANU
local.contributor.authoremailu5605593@anu.edu.au
local.contributor.authoruidKarpinski, Pawel, u5605593
local.contributor.authoruidChen, Xin, u5391750
local.contributor.authoruidShvedov, Vladlen, u4249924
local.contributor.authoruidHnatovsky, Kyrylo (Cyril), u4750651
local.contributor.authoruidLuther-Davies, Barry, u7601418
local.contributor.authoruidKrolikowski, Wieslaw, u9200775
local.contributor.authoruidSheng, Yan, u4876809
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor020400 - CONDENSED MATTER PHYSICS
local.identifier.absfor090600 - ELECTRICAL AND ELECTRONIC ENGINEERING
local.identifier.absfor091200 - MATERIALS ENGINEERING
local.identifier.ariespublicationa383154xPUB2655
local.identifier.doi10.1364/CLEO_SI.2015.STh1H.6
local.identifier.scopusID2-s2.0-84935427809
local.identifier.uidSubmittedBya383154
local.type.statusPublished Versionen_AU

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