Accurate defect recombination parameters: What are the limitations of current analyses?

dc.contributor.authorRougieux, Fiacre E
dc.contributor.authorSun, Ryan
dc.contributor.authorZhu, Yan
dc.contributor.authorMacdonald, Daniel
dc.coverage.spatialWaikoloa Village, USA
dc.date.accessioned2022-11-28T01:17:34Z
dc.date.createdJune 10-15 2018
dc.date.issued2018
dc.date.updated2021-11-28T07:29:41Z
dc.description.abstractA key strategy for further reducing the cost of solar electricity is through the development of very-high efficiency silicon solar cells (>27%). The challenge in achieving this goal lies in overcoming limitations imposed by the electronic quality of the silicon wafers themselves. To overcome this challenge, there is an urgent need for a refined understanding of defects limiting the electronic quality of silicon wafers. This paper provides a nuanced and detailed picture what constitutes accurate recombination parameters for defects in silicon. It outlines three widespread issues in existing measurements of recombination parameters. It enables robust simulation of the lifetime in silicon for solar cell applications.en_AU
dc.description.sponsorshipThis work has been supported by the Australian Research Council (ARC) Discovery Early Career Researcher Fellowship program.en_AU
dc.format.mimetypeapplication/pdfen_AU
dc.identifier.isbn9781538685297en_AU
dc.identifier.urihttp://hdl.handle.net/1885/280446
dc.language.isoen_AUen_AU
dc.publisherIEEEen_AU
dc.relation.ispartofseries7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018en_AU
dc.rights© 2018 IEEEen_AU
dc.source2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSECen_AU
dc.subjectRecombinationen_AU
dc.subjectmultivalenten_AU
dc.subjectdefecten_AU
dc.subjectflawsen_AU
dc.subjectDeep Level Transient Spectroscopyen_AU
dc.subjectTemperature and Injection Dependent Lifetime Spectroscopyen_AU
dc.titleAccurate defect recombination parameters: What are the limitations of current analyses?en_AU
dc.typeConference paperen_AU
local.bibliographicCitation.lastpage2523en_AU
local.bibliographicCitation.startpage2520en_AU
local.contributor.affiliationRougieux, Fiacre E, University of New South Walesen_AU
local.contributor.affiliationSun, Ryan, College of Engineering and Computer Science, ANUen_AU
local.contributor.affiliationZhu, Yan, University of New South Walesen_AU
local.contributor.affiliationMacDonald, Daniel, College of Engineering and Computer Science, ANUen_AU
local.contributor.authoremailu5408594@anu.edu.auen_AU
local.contributor.authoruidSun, Ryan, u5408594en_AU
local.contributor.authoruidMacDonald, Daniel, u9718154en_AU
local.description.embargo2099-12-31
local.description.notesImported from ARIESen_AU
local.description.refereedYes
local.identifier.absfor400909 - Photonic and electro-optical devices, sensors and systems (excl. communications)en_AU
local.identifier.absseo170804 - Solar-photovoltaic energyen_AU
local.identifier.ariespublicationu3102795xPUB194en_AU
local.identifier.doi10.1109/PVSC.2018.8547585en_AU
local.identifier.scopusID2-s2.0-85059890257
local.identifier.uidSubmittedByu3102795en_AU
local.publisher.urlhttps://www.ieee.org/en_AU
local.type.statusPublished Versionen_AU

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