Effect of MeV O2+ implantation on the reactive ion etch rate of LiTaO3
Loading...
Date
Authors
Leech, P W
Ridgway, Mark C
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
The etch rate of LiTaO3 in CF4/CHF3 plasmas was increased by approximately 50% by prior implantation with MeV O2+ ions. The etch rate of LiTaO3 was shown to increase with ion dose, indicating an effect of the implant-induced nuclear damage on the etch process. In general terms, the reactive ion etching of LiTaO3 in CF4/CHF3 plasmas has been identified as a process of ion-enhanced chemical etching.
Description
Citation
Collections
Source
Nuclear Instruments and Methods in Physics Research: Section B
Type
Book Title
Entity type
Access Statement
License Rights
Restricted until
2037-12-31
Downloads
File
Description