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Experimental confirmation of the EPES sampling depth paradox for overlayer/substrate systems

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dc.contributor.authorVos, Maarten
dc.contributor.authorWent, Michael
dc.date.accessioned2015-12-08T22:45:18Z
dc.date.issued2007
dc.date.updated2015-12-08T10:51:57Z
dc.description.abstractElastic-peak electron spectroscopy (EPES) has been one of the main tools for obtaining the inelastic mean free path of electrons in solids. Recently it has become clear that, if this type of experiment is done using an energetic electron beam (20-40 keV)
dc.identifier.issn0039-6028
dc.identifier.urihttp://hdl.handle.net/1885/37771
dc.publisherElsevier
dc.sourceSurface Science
dc.subjectKeywords: Elastic scattering; Electrons; Kinetic energy; Substrates; Thin films; Elastic electron scattering; Elastic peak electron spectroscopy (EPES); Energy separation; Electron spectroscopy Elastic electron scattering; Thin films
dc.titleExperimental confirmation of the EPES sampling depth paradox for overlayer/substrate systems
dc.typeJournal article
local.bibliographicCitation.lastpage1543
local.bibliographicCitation.startpage1536
local.contributor.affiliationVos, Maarten, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationWent, Michael, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidVos, Maarten, u9700295
local.contributor.authoruidWent, Michael, u3210150
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor020406 - Surfaces and Structural Properties of Condensed Matter
local.identifier.ariespublicationu4169254xPUB153
local.identifier.citationvolume601
local.identifier.doi10.1016/j.susc.2007.01.014
local.identifier.scopusID2-s2.0-33847753480
local.type.statusPublished Version

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