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Experimental confirmation of the EPES sampling depth paradox for overlayer/substrate systems

Date

Authors

Vos, Maarten

Went, Michael

Publisher

Elsevier

Abstract

Elastic-peak electron spectroscopy (EPES) has been one of the main tools for obtaining the inelastic mean free path of electrons in solids. Recently it has become clear that, if this type of experiment is done using an energetic electron beam (20-40 keV)

Keywords

Keywords: Elastic scattering; Electrons; Kinetic energy; Substrates; Thin films; Elastic electron scattering; Elastic peak electron spectroscopy (EPES); Energy separation; Electron spectroscopy Elastic electron scattering; Thin films

URI

http://hdl.handle.net/1885/37771

Collections

ANU Research Publications

Source

Surface Science

Type

Journal article

DOI

10.1016/j.susc.2007.01.014

Restricted until

2037-12-31

Downloads

File

Description

01_Vos_Experimental_confirmation_of_2007.pdf (439.92 KB)