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High-energy X-ray diffuse scattering using Weissenberg flat-cone geometry

dc.contributor.authorButler, B
dc.contributor.authorHaeffner, D
dc.contributor.authorLee, Peter T
dc.contributor.authorWelberry, Thomas
dc.date.accessioned2015-12-13T23:17:37Z
dc.date.available2015-12-13T23:17:37Z
dc.date.issued2000
dc.date.updated2015-12-12T08:53:46Z
dc.description.abstractA technique for the measurement of diffuse X-ray scattering on individual reciprocal-space planes using high-energy X-ray photons is described. The method is demonstrated using a disordered crystal of the compound T1SbOGeO4 and compared to data collected
dc.identifier.issn0021-8898
dc.identifier.urihttp://hdl.handle.net/1885/89797
dc.publisherWiley-Blackwell
dc.sourceJournal of Applied Crystallography
dc.subjectKeywords: antimony derivative; article; camera; crystal; filter; fluorescence; geometry; light scattering; measurement; methodology; technique; X ray diffraction
dc.titleHigh-energy X-ray diffuse scattering using Weissenberg flat-cone geometry
dc.typeJournal article
local.bibliographicCitation.lastpage1050
local.bibliographicCitation.startpage1046
local.contributor.affiliationButler, B, National Institute of Standards and Technology
local.contributor.affiliationHaeffner, D, Argonne National Laboratory
local.contributor.affiliationLee, Peter T, University of Western Australia
local.contributor.affiliationWelberry, Thomas, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidWelberry, Thomas, u7500616
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor030606 - Structural Chemistry and Spectroscopy
local.identifier.ariespublicationMigratedxPub20013
local.identifier.citationvolume33
local.identifier.doi10.1107/S0021889800005318
local.identifier.scopusID2-s2.0-0034477992
local.type.statusPublished Version

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