High-energy X-ray diffuse scattering using Weissenberg flat-cone geometry
Date
Authors
Butler, B
Haeffner, D
Lee, Peter T
Welberry, Thomas
Journal Title
Journal ISSN
Volume Title
Publisher
Wiley-Blackwell
Abstract
A technique for the measurement of diffuse X-ray scattering on individual reciprocal-space planes using high-energy X-ray photons is described. The method is demonstrated using a disordered crystal of the compound T1SbOGeO4 and compared to data collected
Description
Citation
Collections
Source
Journal of Applied Crystallography