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Evolution of Palladium Related Defects in Silicon

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dc.contributor.authorDogra, R
dc.contributor.authorSharma, A K
dc.contributor.authorByrne, Aidan
dc.contributor.authorRidgway, Mark C
dc.coverage.spatialMumbai India
dc.date.accessioned2015-12-10T22:54:36Z
dc.date.createdDecember 3-7 2012
dc.date.issued2012
dc.date.updated2016-02-24T10:19:23Z
dc.description.abstractThe perturbed angular correlation technique is very well suited to characterize the structural, dynamic and electronic properties of impurity or impurity-defect complexes on an atomic scale. Using radioisotope probe 100Pd/100Rh, such measurements have bee
dc.identifier.isbn9780735410442
dc.identifier.urihttp://hdl.handle.net/1885/59715
dc.publisherAmerican Institute of Physics (AIP)
dc.relation.ispartofseriesSolid State Physics Symposium (DAE-SSPS 2012)
dc.sourceProceedings of the 57th DAE Solid State Physics Symposium (DAE-SSPS 2012)
dc.source.urihttp://www.barc.gov.in/symposium/ssps2012/
dc.subjectKeywords: Defects; Palladium; Perturbed Angular Correlation; Silicon
dc.titleEvolution of Palladium Related Defects in Silicon
dc.typeConference paper
local.bibliographicCitation.lastpage1034
local.bibliographicCitation.startpage1033
local.contributor.affiliationDogra, R, Beant College of Engineering and Technology
local.contributor.affiliationSharma, A K, Beant College of Engineering and Technology
local.contributor.affiliationByrne, Aidan, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidByrne, Aidan, u8900906
local.contributor.authoruidRidgway, Mark C, u9001886
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor020406 - Surfaces and Structural Properties of Condensed Matter
local.identifier.absseo970102 - Expanding Knowledge in the Physical Sciences
local.identifier.ariespublicationU3594520xPUB505
local.identifier.doi10.1063/1.4710358
local.identifier.scopusID2-s2.0-84876791252
local.identifier.thomsonID000306973500499
local.type.statusPublished Version

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