Evolution of Palladium Related Defects in Silicon

Dogra, R; Sharma, A K; Byrne, Aidan; Ridgway, Mark C

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Evolution of Palladium Related Defects in Silicon

Date

2012

Authors

Dogra, R

Sharma, A K

Byrne, Aidan

Ridgway, Mark C

Publisher

American Institute of Physics (AIP)

Abstract

The perturbed angular correlation technique is very well suited to characterize the structural, dynamic and electronic properties of impurity or impurity-defect complexes on an atomic scale. Using radioisotope probe 100Pd/100Rh, such measurements have bee