Implications of laser-doping parameters and contact opening size on contact resistivity
Loading...
Date
Authors
Huyeng, Jonas
Ernst, Marco
Fong, Kean Chern
Walter, Daniel
Blakers, Andrew
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Abstract
Advanced silicon solar cells implement complex structures on both front and rear side. Laser processing has been shown to be a versatile and cost-effective technology for such applications. Local silicon doping or contact opening via ablation are two established process steps. In this work, we investigate their influence on the quality of local contacts with a focus on contact resistivity. We determine values for ρC down to 70 μΩ cm2 and 30 μΩ cm2 for phosphorus and boron respectively, on a simple test structure with the help of three-dimensional numerical simulations.
Description
Citation
Collections
Source
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
Type
Book Title
Entity type
Access Statement
License Rights
Restricted until
2099-12-31