Analysis of multi-layer ERBS spectra
| dc.contributor.author | Marmitt, G. G. | |
| dc.contributor.author | Rosa, L. F. S. | |
| dc.contributor.author | Nandi, S. K. | |
| dc.contributor.author | Vos, M. | |
| dc.date.accessioned | 2015-05-07T03:19:44Z | |
| dc.date.available | 2015-05-07T03:19:44Z | |
| dc.date.issued | 2015-02-21 | |
| dc.date.updated | 2016-06-14T08:28:04Z | |
| dc.description.abstract | A systematic way of analysis of multi-layer electron Rutherford backscattering spectra is described. The approach uses fitting in terms of physical meaningful parameters. Simultaneous analysis then becomes possible for spectra taken at different incoming energies and measurement geometries. Examples are given to demonstrate the level of detail that can be resolved by this technique. | |
| dc.description.sponsorship | This work was realized with support from CNPq, Conselho Nacional de Desenvolvimento Científico e Tecnológico – Brazil and the Australian Research Council. | en_AU |
| dc.identifier.issn | 0368-2048 | en_AU |
| dc.identifier.uri | http://hdl.handle.net/1885/13402 | |
| dc.publisher | Elsevier | |
| dc.rights | © 2015 Elsevier B.V. | |
| dc.source | Journal of Electron Spectroscopy and Related Phenomena | |
| dc.subject | Electron Rutherford backscattering | |
| dc.subject | Surface analysis | |
| dc.subject | Depth profiling | |
| dc.title | Analysis of multi-layer ERBS spectra | |
| dc.type | Journal article | |
| dcterms.dateAccepted | 2015-02-14 | |
| local.bibliographicCitation.lastpage | 32 | en_AU |
| local.bibliographicCitation.startpage | 26 | en_AU |
| local.contributor.affiliation | Marmitt, G. G., Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.affiliation | Vos, M., Research School of Physics and Engineering, The Australian National University | en_AU |
| local.contributor.authoruid | u9700295 | en_AU |
| local.identifier.absfor | 020200 - ATOMIC, MOLECULAR, NUCLEAR, PARTICLE AND PLASMA PHYSICS | |
| local.identifier.absfor | 091207 - Metals and Alloy Materials | |
| local.identifier.absfor | 100712 - Nanoscale Characterisation | |
| local.identifier.ariespublication | a383154xPUB1221 | |
| local.identifier.citationvolume | 202 | en_AU |
| local.identifier.doi | 10.1016/j.elspec.2015.02.009 | en_AU |
| local.identifier.scopusID | 2-s2.0-84924359014 | |
| local.publisher.url | http://www.elsevier.com/ | en_AU |
| local.type.status | Published Version | en_AU |
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