Large Melting-point Hysteresis of Ge Nanocrystals Embedded in SiO 2

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dc.contributor.authorXu, Q
dc.contributor.authorSharp, I D
dc.contributor.authorYuan, C W
dc.contributor.authorYi, D O
dc.contributor.authorLiao, C Y
dc.contributor.authorGlaeser, Andreas M
dc.contributor.authorMinor, A M
dc.contributor.authorBeeman, J W
dc.contributor.authorRidgway, Mark C
dc.contributor.authorKluth, Patrick
dc.contributor.authorAger, J W
dc.contributor.authorChrzan, D C
dc.contributor.authorHaller, E E
dc.date.accessioned2015-12-13T22:41:56Z
dc.date.issued2006
dc.date.updated2015-12-11T10:04:31Z
dc.description.abstractThe melting behavior of Ge nanocrystals embedded within SiO2 is evaluated using in situ transmission electron microscopy. The observed melting-point hysteresis is large (±17%) and nearly symmetric about the bulk melting point. This hysteresis is modeled
dc.identifier.issn0031-9007
dc.identifier.urihttp://hdl.handle.net/1885/78734
dc.publisherAmerican Physical Society
dc.sourcePhysical Review Letters
dc.subjectKeywords: Classical nucleation theory; Melting-point hysteresis; Epitaxial growth; Germanium; Hysteresis; Nucleation; Silica; Transmission electron microscopy; Nanostructured materials
dc.titleLarge Melting-point Hysteresis of Ge Nanocrystals Embedded in SiO 2
dc.typeJournal article
local.bibliographicCitation.issue15
local.bibliographicCitation.startpage155701-1-4
local.contributor.affiliationXu, Q, University of California
local.contributor.affiliationSharp, I D, University of California
local.contributor.affiliationYuan, C W, University of California
local.contributor.affiliationYi, D O, Lawrence Berkeley National Laboratory
local.contributor.affiliationLiao, C Y, University of California
local.contributor.affiliationGlaeser, Andreas M, University of California
local.contributor.affiliationMinor, A M, Lawrence Berkeley National Laboratory
local.contributor.affiliationBeeman, J W, Lawrence Berkeley National Laboratory
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKluth, Patrick, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationAger, J W, Lawrence Berkeley National Laboratory
local.contributor.affiliationChrzan, D C, University of California
local.contributor.affiliationHaller, E E, University of California
local.contributor.authoruidRidgway, Mark C, u9001886
local.contributor.authoruidKluth, Patrick, u4054452
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor020406 - Surfaces and Structural Properties of Condensed Matter
local.identifier.absfor100799 - Nanotechnology not elsewhere classified
local.identifier.ariespublicationMigratedxPub7327
local.identifier.citationvolume97
local.identifier.doi10.1103/PhysRevLett.97.155701
local.identifier.scopusID2-s2.0-33749578036
local.type.statusPublished Version

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