Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO[sub 2]

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dc.contributor.authorKluth, P.
dc.contributor.authorJohannessen, B.
dc.contributor.authorGiraud, V.
dc.contributor.authorCheung, A.
dc.contributor.authorGlover, C. J.
dc.contributor.authorAzevedo, G. de M.
dc.contributor.authorForan, G. J.
dc.contributor.authorRidgway, M. C.
dc.date.accessioned2015-10-07T03:14:25Z
dc.date.available2015-10-07T03:14:25Z
dc.date.issued2004-10-18
dc.date.updated2015-12-12T08:09:48Z
dc.description.abstractAu nanocrystals (NCs) fabricated by ion implantation into thin SiO₂ and annealing were investigated by means of extended x-rayabsorption fine structure (EXAFS)spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO₂ matrix. Cumulant analysis of the EXAFS data suggests surface reconstruction or relaxation involving a further shortened bond length. A deviation from the octahedral closed shell structure is apparent for NCs of size 25Å.
dc.description.sponsorshipP. K. is grateful to the Humboldt Foundation in Germany for support. P.K., B.J., A.C., C.J.G., G.d.M.A., G.J.F., and M.C.R. were supported by the Australian Synchrotron Research Program.en_AU
dc.identifier.issn0003-6951en_AU
dc.identifier.urihttp://hdl.handle.net/1885/15793
dc.publisherAmerican Institute of Physics
dc.rightshttp://www.sherpa.ac.uk/romeo/issn/0003-6951..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 7/10/15). Copyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at https://doi.org/10.1063/1.1803619
dc.sourceApplied Physics Letters
dc.titleBond length contraction in Au nanocrystals formed by ion implantation into thin SiO[sub 2]
dc.typeJournal article
local.bibliographicCitation.issue16en_AU
local.bibliographicCitation.lastpage3563
local.bibliographicCitation.startpage3561en_AU
local.contributor.affiliationKluth, Patrick, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationJohannessen, Bernt, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationGiraud, V, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationCheung, Allen, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationGlover, Christopher, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationde Azevedo, Gustavo, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationForan, Garry J, Australian Nuclear Science and Technology Organisation, Australiaen_AU
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.authoruidu4054452en_AU
local.description.notesImported from ARIESen_AU
local.description.refereedYes
local.identifier.absfor020406en_AU
local.identifier.ariespublicationMigratedxPub15089en_AU
local.identifier.citationvolume85en_AU
local.identifier.doi10.1063/1.1803619en_AU
local.identifier.scopusID2-s2.0-9744225834
local.publisher.urlhttps://www.aip.org/en_AU
local.type.statusPublished Versionen_AU

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