Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO[sub 2]
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Kluth, P.
Johannessen, B.
Giraud, V.
Cheung, A.
Glover, C. J.
Azevedo, G. de M.
Foran, G. J.
Ridgway, M. C.
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American Institute of Physics
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Au nanocrystals (NCs) fabricated by ion implantation into thin SiO₂ and annealing were investigated by means of extended x-rayabsorption fine structure (EXAFS)spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO₂ matrix. Cumulant analysis of the EXAFS data suggests surface reconstruction or relaxation involving a further shortened bond length. A deviation from the octahedral closed shell structure is apparent for NCs of size 25Å.
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Applied Physics Letters
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