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Introduction to X-Ray Absorption Spectroscopy

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dc.contributor.authorSchnohr, Claudia
dc.contributor.authorRidgway, Mark C
dc.date.accessioned2015-12-10T23:02:57Z
dc.date.issued2015
dc.date.updated2016-06-14T08:55:28Z
dc.description.abstractX-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.
dc.identifier.isbn9783662443613
dc.identifier.urihttp://hdl.handle.net/1885/61970
dc.publisherSpringer
dc.relation.ispartofX-Ray Absorption Spectroscopy of Semiconductors
dc.relation.isversionof1 Edition
dc.rightsCopyright Information: © Springer International Publishing AG
dc.titleIntroduction to X-Ray Absorption Spectroscopy
dc.typeBook chapter
local.bibliographicCitation.lastpage26
local.bibliographicCitation.placeofpublicationNew York
local.bibliographicCitation.startpage1
local.contributor.affiliationSchnohr, Claudia, Friedrich Schiller University
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidRidgway, Mark C, u9001886
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor020406 - Surfaces and Structural Properties of Condensed Matter
local.identifier.absseo970102 - Expanding Knowledge in the Physical Sciences
local.identifier.ariespublicationU3594520xPUB655
local.identifier.doi10.1007/978-3-662-44362-0_1
local.identifier.scopusID2-s2.0-84921468520
local.type.statusPublished Version

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