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Introduction to X-Ray Absorption Spectroscopy

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Date

2015

Authors

Schnohr, Claudia
Ridgway, Mark C

Journal Title

Journal ISSN

Volume Title

Publisher

Springer

Abstract

X-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.

Description

Keywords

Citation

URI

http://hdl.handle.net/1885/61970

Collections

ANU Research Publications

Source

Type

Book chapter

Book Title

X-Ray Absorption Spectroscopy of Semiconductors

Entity type

Access Statement

License Rights

DOI

10.1007/978-3-662-44362-0_1

Restricted until

2037-12-31

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01_Schnohr_Introduction_to_X-Ray_2015.pdf (665.75 KB)

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