Cultural advice

The Australian National University acknowledges, celebrates and pays our respects to the Ngunnawal and Ngambri people of the Canberra region and to all First Nations Australians on whose traditional lands we meet and work, and whose cultures are among the oldest continuing cultures in human history.

Aboriginal and Torres Strait Islander peoples are advised that ANU Library collections may include images, names, voices, and other representations of deceased persons.

Material in the collection may contain terms, language or views that reflect the period in which the item was created and may be considered inappropriate today.

Series Resistance as a Function of Current and its Application in Solar Cell Analysis

dc.contributor.authorFong, Keanen_AU
dc.contributor.authorMcIntosh, Keithen_AU
dc.contributor.authorFranklin, Evanen_AU
dc.contributor.authorBlakers, Andrewen_AU
dc.coverage.spatialSeattle USA
dc.date.accessioned2015-12-07T22:19:20Z
dc.date.createdJune 19-24 2011
dc.date.issued2011
dc.date.updated2016-02-24T11:34:28Z
dc.description.abstractThe series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract Rs-light and Rs-dark as a function of current. Application of Rs(J) to analysis of solar cell is demonstrated by extracting the Rs-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic Rs effects. Since the Rs(J) and Rs-corrected J-V data is measured in high detail, the total losses from the Rs and the pseudo efficiency can be measured without need of curve fitting. Finally, by including Rs(J) to the modelling of solar cells, errors in parameterization caused by variation in Rs value is eliminated.
dc.identifier.urihttp://hdl.handle.net/1885/19283
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE Inc)
dc.relation.ispartofseriesIEEE Photovoltaic Specialists Conference (PVSC 2011)
dc.sourceProceedings of IEEE Photovoltaic Specialists Conference (PVSC 2011)
dc.source.urihttp://ieeexplore.ieee.org/servlet/opac?punumber=6177424
dc.subjectKeywords: Cell analysis; Operating condition; P-n junction; Photovoltaic; Series resistances; Solar cell characterization; Total loss; Curve fitting; Photovoltaic effects; Semiconductor junctions; Electric resistance
dc.titleSeries Resistance as a Function of Current and its Application in Solar Cell Analysis
dc.typeConference paper
local.bibliographicCitation.lastpage002261
local.bibliographicCitation.startpage002257
local.contributor.affiliationFong, Kean, College of Engineering and Computer Science, ANU
local.contributor.affiliationMcIntosh, Keith, PV Lighthouse
local.contributor.affiliationBlakers, Andrew, College of Engineering and Computer Science, ANU
local.contributor.affiliationFranklin, Evan, College of Engineering and Computer Science, ANU
local.contributor.authoruidFong, Kean, u4448270
local.contributor.authoruidBlakers, Andrew, u9113453
local.contributor.authoruidFranklin, Evan, u4038737
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor020501 - Classical and Physical Optics
local.identifier.absfor090605 - Photodetectors, Optical Sensors and Solar Cells
local.identifier.absseo850504 - Solar-Photovoltaic Energy
local.identifier.ariespublicationu5114172xPUB7
local.identifier.ariespublicationf5625xPUB11651
local.identifier.doi10.1109/PVSC.2011.6186405
local.identifier.scopusID2-s2.0-84861037900
local.type.statusPublished Version

Downloads

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
01_Fong_Series_Resistance_as_a_2011.pdf
Size:
279.46 KB
Format:
Adobe Portable Document Format
abcd