Series Resistance as a Function of Current and its Application in Solar Cell Analysis

Date

2011

Authors

Fong, Kean
McIntosh, Keith
Franklin, Evan
Blakers, Andrew

Journal Title

Journal ISSN

Volume Title

Publisher

Institute of Electrical and Electronics Engineers (IEEE Inc)

Abstract

The series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract Rs-light and Rs-dark as a function of current. Application of Rs(J) to analysis of solar cell is demonstrated by extracting the Rs-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic Rs effects. Since the Rs(J) and Rs-corrected J-V data is measured in high detail, the total losses from the Rs and the pseudo efficiency can be measured without need of curve fitting. Finally, by including Rs(J) to the modelling of solar cells, errors in parameterization caused by variation in Rs value is eliminated.

Description

Keywords

Keywords: Cell analysis; Operating condition; P-n junction; Photovoltaic; Series resistances; Solar cell characterization; Total loss; Curve fitting; Photovoltaic effects; Semiconductor junctions; Electric resistance

Citation

Source

Proceedings of IEEE Photovoltaic Specialists Conference (PVSC 2011)

Type

Conference paper

Book Title

Entity type

Access Statement

License Rights

DOI

10.1109/PVSC.2011.6186405

Restricted until

2037-12-31