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Filament-type resistive switching in homogeneous Bi-layer Pr0.7Ca0.3MnO3 thin film memory devices

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Authors

Liu, Xinjun
Biju, Kuyyadi P.
Bourim, El Mostafa
Park, Sangsu
Lee, Wootae
Lee, Daeseok
Seo, Kyungah
Hwang, Hyunsang

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Electrochemical Society Inc

Abstract

It is known that Pt/ Pr0.7 Ca0.3 Mn O3 (PCMO)/Pt structures show no hysteresis loops in current-voltage curves due to the symmetric top and bottom interfaces. Here, we prepared an asymmetric memory device using bi-layer PCMO thin films with different oxygen content. The repeatable and stable resistive switching is observed. The excellent resistive switching characteristics such as a large RHRS / RLRS (where HRS is the high resistance state and LRS is the low resistance state) ratio (∼1000), sweeping endurance (>100), and long retention time (> 105 s) can be obtained using a bipolar operation mode. It is suggested that the switching process can be elucidated to the formation and rupture of localized conductive filament along with the migration of oxygen ions.

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Electrochemical and Solid-State Letters

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Restricted until

2037-12-31
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