Improved resistive switching properties in Pt/Pr0.7Ca 0.3MnO3/Y2O3-stabilized ZrO 2/W via-hole structures
dc.contributor.author | Liu, Xinjun | |
dc.contributor.author | Biju, Kuyyadi P. | |
dc.contributor.author | Park, Sangsu | |
dc.contributor.author | Kim, Insung | |
dc.contributor.author | Siddik, Manzar | |
dc.contributor.author | Sadaf, Sharif Md. | |
dc.contributor.author | Hwang, Hyunsang | |
dc.date.accessioned | 2015-12-10T23:18:13Z | |
dc.date.available | 2015-12-10T23:18:13Z | |
dc.date.issued | 2011 | |
dc.date.updated | 2016-02-24T09:57:13Z | |
dc.description.abstract | An yttria-stabilized zirconia (YSZ) (∼10 nm) layer was designed and introduced by a pulse laser deposition method before a Pr0.7Ca0.3MnO3 (PCMO) film was deposited on the W bottom electrode (BE) with a sub-micron via-hole structure. Comparing Pt/PCMO/W | |
dc.identifier.issn | 1567-1739 | |
dc.identifier.uri | http://hdl.handle.net/1885/65528 | |
dc.publisher | Elsevier | |
dc.source | Current Applied Physics | |
dc.subject | Keywords: Bottom electrodes; Low-power consumption; Oxygen ions; Pulse laser deposition; Pulse measurements; ReRAM; Resistive switching; Submicron; Tunneling barrier; Via-hole; DC power transmission; Manganese oxide; Switching systems; Zirconia; Structural properti Manganites thin film; ReRAM; Resistive switching; Tunneling barrier | |
dc.title | Improved resistive switching properties in Pt/Pr0.7Ca 0.3MnO3/Y2O3-stabilized ZrO 2/W via-hole structures | |
dc.type | Journal article | |
local.bibliographicCitation.issue | 2 SUPPL. | |
local.bibliographicCitation.lastpage | e61 | |
local.bibliographicCitation.startpage | e58 | |
local.contributor.affiliation | Liu, Xinjun, College of Physical and Mathematical Sciences, ANU | |
local.contributor.affiliation | Biju, Kuyyadi P., Gwangju Institute of Science and Technology | |
local.contributor.affiliation | Park, Sangsu, Gwangju Institute of Science and Technology | |
local.contributor.affiliation | Kim, Insung, Gwangju Institute of Science and Technology | |
local.contributor.affiliation | Siddik, Manzar, Gwangju Institute of Science and Technology | |
local.contributor.affiliation | Sadaf, Sharif Md., Gwangju Institute of Science and Technology | |
local.contributor.affiliation | Hwang, Hyunsang, Gwangju Institute of Science and Technology | |
local.contributor.authoremail | u5361480@anu.edu.au | |
local.contributor.authoruid | Liu, Xinjun, u5361480 | |
local.description.notes | Imported from ARIES | |
local.identifier.absfor | 100705 - Nanoelectronics | |
local.identifier.absfor | 090604 - Microelectronics and Integrated Circuits | |
local.identifier.absfor | 091205 - Functional Materials | |
local.identifier.ariespublication | U3488905xPUB1119 | |
local.identifier.citationvolume | 11 | |
local.identifier.doi | 10.1016/j.cap.2010.11.123 | |
local.identifier.scopusID | 2-s2.0-79960899808 | |
local.identifier.thomsonID | 000294208600013 | |
local.identifier.uidSubmittedBy | U3488905 | |
local.type.status | Published Version |