In situ hole doping of wide-gap semiconductors by dual-target simultaneous laser ablation: GaN and SiC epitaxial films
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Muto, Hachizo
Asano, Takashi
Wang, Rong-Ping
Kusumori, Takeshi
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American Institute of Physics (AIP)
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Apparatus for dual-target simultaneous laser ablation deposition and in situdoping techniques have been developed to achieve p-type doping during epitaxialgrowth of wide-band-gap semiconductors. The apparatus has two target holders with a target-rotation mechanism and a rotation-axis adjusting mechanism to obtain homogeneously dopedfilms. Mg-doped GaNfilms have been fabricated on 6H–SiC(0001) and Si(111) substrates in NH₃ ambient by simultaneous ablation of GaN and Mg-metal targets using two lasers. Junctions of the films with n-type substrates show a diode curve characteristic of p-n junctions, but not for junction with p-Si, indicating hole doping without further procedures. In situ p-type doping to SiC was also achieved by using SiC and Al₄C₃ targets.
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Applied Physics Letters
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