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Problems in measuring diffuse X-ray scattering

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dc.contributor.authorWelberry, Thomas Richard
dc.contributor.authorGoossens, Darren
dc.contributor.authorHeerdegen, Aidan
dc.contributor.authorLee, Peter T.
dc.date.accessioned2015-12-13T22:45:50Z
dc.date.available2015-12-13T22:45:50Z
dc.date.issued2005
dc.date.updated2015-12-11T10:25:24Z
dc.description.abstractProblems encountered in making measurements of diffuse X-ray scattering are discussed. These generally arise from the need to measure very weak scattering in the presence of very strong scattering (Bragg peaks) using multi-detectors of various kinds.
dc.identifier.issn0044-2968
dc.identifier.urihttp://hdl.handle.net/1885/79971
dc.publisherR Oldenbourg Verlag
dc.sourceZeitschrift fur Kristallographie
dc.subjectBlooming
dc.subjectDiffraction artefacts
dc.subjectDiffuse scattering measurement
dc.subjectX-ray diffraction
dc.titleProblems in measuring diffuse X-ray scattering
dc.typeJournal article
local.bibliographicCitation.issue12
local.bibliographicCitation.lastpage1058
local.bibliographicCitation.startpage1052
local.contributor.affiliationWelberry, Thomas, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationGoossens, Darren, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationHeerdegen, Aidan, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationLee, Peter T, University of Western Australia
local.contributor.authoruidWelberry, Thomas, u7500616
local.contributor.authoruidGoossens, Darren, u4000307
local.contributor.authoruidHeerdegen, Aidan, u9115508
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor030606 - Structural Chemistry and Spectroscopy
local.identifier.ariespublicationMigratedxPub8320
local.identifier.citationvolume220
local.identifier.doi10.1524/zkri.2005.220.12_2005.1052
local.identifier.scopusID2-s2.0-27144526403
local.type.statusMetadata only

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