Problems in measuring diffuse X-ray scattering
Date
2005
Authors
Welberry, Thomas Richard
Goossens, Darren
Heerdegen, Aidan
Lee, Peter T.
Journal Title
Journal ISSN
Volume Title
Publisher
R Oldenbourg Verlag
Abstract
Problems encountered in making measurements of diffuse X-ray scattering are discussed. These generally arise from the need to measure very weak scattering in the presence of very strong scattering (Bragg peaks) using multi-detectors of various kinds.
Description
Keywords
Blooming, Diffraction artefacts, Diffuse scattering measurement, X-ray diffraction
Citation
Collections
Source
Zeitschrift fur Kristallographie
Type
Journal article