General Semiconductor Junction Relations

Date

1957

Authors

Fletcher, Neville H.

Journal Title

Journal ISSN

Volume Title

Publisher

Taylor & Francis

Abstract

General carrier density relations are derived for the case of an abrupt junction between two sections of semiconductor with arbitrary impurity contents and with an arbitrary applied bias. These relations reduce to those of Shockley at very low bias Levels, but in addition take account of all types of conductivity modulation effects.

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Citation

Source

Journal of Electronics and Control

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

Restricted until

2037-12-31

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