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General Semiconductor Junction Relations

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Date

Authors

Fletcher, Neville H.

Journal Title

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Volume Title

Publisher

Taylor & Francis

Abstract

General carrier density relations are derived for the case of an abrupt junction between two sections of semiconductor with arbitrary impurity contents and with an arbitrary applied bias. These relations reduce to those of Shockley at very low bias Levels, but in addition take account of all types of conductivity modulation effects.

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Citation

Source

Journal of Electronics and Control

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Access Statement

License Rights

Restricted until

2037-12-31

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