Protection of Si-Sio2 interfaces from damp heat by overlying SiNx and Si3N4 coatings
| dc.contributor.author | DAI, Xi | |
| dc.contributor.author | McIntosh, Keith | |
| dc.coverage.spatial | Honolulu, HI | |
| dc.date.accessioned | 2015-12-13T22:59:39Z | |
| dc.date.created | June 20-25 2010 | |
| dc.date.issued | 2010 | |
| dc.date.updated | 2016-02-24T08:41:10Z | |
| dc.description.abstract | PECVD SiNx antireflection coatings are found to suppress the degradation of an underlying oxide during "damp-heat" exposure. Samples are submitted to 85 °C and 85% relative humidity, replicating the damp-heat conditions of the standard reliability tests | |
| dc.identifier.isbn | 9781424458912 | |
| dc.identifier.uri | http://hdl.handle.net/1885/83917 | |
| dc.publisher | IEEE | |
| dc.relation.ispartofseries | 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 | |
| dc.source | Conference Record of the IEEE Photovoltaic Specialists Conference | |
| dc.subject | Keywords: A-thermal; Damp heat; Diffusion of water; Elevated temperature; Emitter saturation current density; Heat conditions; High efficiency; Oxide thickness; Presence of water; PV modules; Relative humidities; Reliability test; Silicon cells; Atmospheric humidit | |
| dc.title | Protection of Si-Sio2 interfaces from damp heat by overlying SiNx and Si3N4 coatings | |
| dc.type | Conference paper | |
| local.bibliographicCitation.lastpage | 3209 | |
| local.bibliographicCitation.startpage | 3205 | |
| local.contributor.affiliation | DAI, Xi, College of Engineering and Computer Science, ANU | |
| local.contributor.affiliation | McIntosh, Keith, College of Engineering and Computer Science, ANU | |
| local.contributor.authoruid | DAI, Xi, u4185777 | |
| local.contributor.authoruid | McIntosh, Keith, u4249405 | |
| local.description.embargo | 2037-12-31 | |
| local.description.notes | Imported from ARIES | |
| local.description.refereed | Yes | |
| local.identifier.absfor | 020501 - Classical and Physical Optics | |
| local.identifier.absfor | 090699 - Electrical and Electronic Engineering not elsewhere classified | |
| local.identifier.absfor | 091299 - Materials Engineering not elsewhere classified | |
| local.identifier.ariespublication | f5625xPUB12191 | |
| local.identifier.doi | 10.1109/PVSC.2010.5616776 | |
| local.identifier.scopusID | 2-s2.0-78650093225 | |
| local.type.status | Published Version |