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Observation of hexagonal crystalline diffraction from growing silicate films

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dc.contributor.authorHolt, Stephen
dc.contributor.authorForan, Garry J
dc.contributor.authorWhite, John
dc.date.accessioned2015-12-13T23:35:10Z
dc.date.issued1999
dc.date.updated2015-12-12T09:38:56Z
dc.description.abstractClear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.
dc.identifier.issn0743-7463
dc.identifier.urihttp://hdl.handle.net/1885/93790
dc.publisherAmerican Chemical Society
dc.sourceLangmuir
dc.subjectKeywords: Crystal structure; Film growth; Phase interfaces; Synchrotron radiation; X ray crystallography; Grazing incidence X-ray diffraction (GIXD) analysis; Silicates
dc.titleObservation of hexagonal crystalline diffraction from growing silicate films
dc.typeJournal article
local.bibliographicCitation.issue7
local.bibliographicCitation.lastpage2542
local.bibliographicCitation.startpage2540
local.contributor.affiliationHolt, Stephen, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationForan, Garry J, Australian Nuclear Science and Technology Organisation
local.contributor.affiliationWhite, John, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidHolt, Stephen, u9708710
local.contributor.authoruidWhite, John, u8506305
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor030603 - Colloid and Surface Chemistry
local.identifier.ariespublicationMigratedxPub25203
local.identifier.citationvolume15
local.identifier.doi10.1021/la981390u
local.identifier.scopusID2-s2.0-0344672462
local.type.statusPublished Version

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