Observation of hexagonal crystalline diffraction from growing silicate films
Date
1999
Authors
Holt, Stephen
Foran, Garry J
White, John
Journal Title
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Volume Title
Publisher
American Chemical Society
Abstract
Clear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.
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Keywords
Keywords: Crystal structure; Film growth; Phase interfaces; Synchrotron radiation; X ray crystallography; Grazing incidence X-ray diffraction (GIXD) analysis; Silicates
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Source
Langmuir
Type
Journal article
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2037-12-31
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