Preferential Amorphization and Defect Annihilation at Nanocavities in Silicon Durion Ion Irradiation
dc.contributor.author | Williams, James | |
dc.contributor.author | Zhu, Xiaohua | |
dc.contributor.author | Ridgway, Mark C | |
dc.contributor.author | Conway, Martin | |
dc.contributor.author | Williams, Ben C | |
dc.contributor.author | Fortuna, Frank Nicholas | |
dc.contributor.author | Ruault, M-O | |
dc.contributor.author | Bernas, Harry | |
dc.date.accessioned | 2015-12-07T22:42:47Z | |
dc.date.issued | 2000 | |
dc.date.updated | 2015-12-07T11:11:29Z | |
dc.description.abstract | Si containing a band of nanocavities has been irradiated with Si+ ions at elevated temperatures to study interactions of irradiation-induced defects with open volume defects. For irradiation at 100°C, nanocavities are shown to be preferential nucleation | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | http://hdl.handle.net/1885/24694 | |
dc.publisher | American Institute of Physics (AIP) | |
dc.source | Applied Physics Letters | |
dc.title | Preferential Amorphization and Defect Annihilation at Nanocavities in Silicon Durion Ion Irradiation | |
dc.type | Journal article | |
local.bibliographicCitation.lastpage | 4282 | |
local.bibliographicCitation.startpage | 4280 | |
local.contributor.affiliation | Williams, James, College of Physical and Mathematical Sciences, ANU | |
local.contributor.affiliation | Zhu, Xiaohua, College of Physical and Mathematical Sciences, ANU | |
local.contributor.affiliation | Ridgway, Mark C, College of Physical and Mathematical Sciences, ANU | |
local.contributor.affiliation | Conway, Martin, College of Physical and Mathematical Sciences, ANU | |
local.contributor.affiliation | Williams, Ben C, College of Physical and Mathematical Sciences, ANU | |
local.contributor.affiliation | Fortuna, Frank Nicholas, Universite d'Evry | |
local.contributor.affiliation | Ruault, M-O, Universite Paris | |
local.contributor.affiliation | Bernas, Harry, CNRS | |
local.contributor.authoremail | u8809701@anu.edu.au | |
local.contributor.authoruid | Williams, James, u8809701 | |
local.contributor.authoruid | Zhu, Xiaohua, u4046809 | |
local.contributor.authoruid | Ridgway, Mark C, u9001886 | |
local.contributor.authoruid | Conway, Martin, u9300106 | |
local.contributor.authoruid | Williams, Ben C, u3228525 | |
local.description.embargo | 2037-12-31 | |
local.description.notes | Imported from ARIES | |
local.description.refereed | Yes | |
local.identifier.absfor | 020406 - Surfaces and Structural Properties of Condensed Matter | |
local.identifier.ariespublication | MigratedxPub34 | |
local.identifier.citationvolume | 77 | |
local.identifier.scopusID | 2-s2.0-0000768806 | |
local.identifier.uidSubmittedBy | Migrated | |
local.type.status | Published Version |
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