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Substrate-dependent structure, microstructure, composition and properties of nanostructured TiN films

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Authors

Mangalampalli, S.R.N. Kiran
Krishna, Ghanashyam
Padmanabhan, K.A.

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Publisher

Pergamon-Elsevier Ltd

Abstract

Titanium nitride films of a thickness of ∼1.5 μm were deposited on amorphous and crystalline substrates by DC reactive magnetron sputtering at ambient temperature with 100% nitrogen in the sputter gas. The growth of nanostructured, i.e. crystalline nan

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Citation

Source

Solid State Communications

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Restricted until

2037-12-31