Growth of Highly Ordered Thin Silicate Films at the Air-Water Interface
Date
1998
Authors
Brown, A S
Holt, Stephen
Reynolds, Philip
Penfold, J
White, John
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American Chemical Society
Abstract
The growth of thin silicate-organic films at the air-water interface of surfactant solutions has been studied in situ by X-ray and neutron reflectivity to a resolution of ca. 5 Å. Surfactant in the solution and the air-water interface itself are involved
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Langmuir
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Journal article
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2037-12-31
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