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Estimation of solidification interface shapes in a boron-phosphorus compensated multicrystalline silicon ingot via photoluminescence imaging

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Date

2013

Authors

Lim, Siew Yee
Forster, Maxime
MacDonald, Daniel

Journal Title

Journal ISSN

Volume Title

Publisher

Elsevier

Abstract

This paper introduces a method for estimating the shape of the solidification front along the height of a directionally-solidified multicrystalline silicon ingot. The technique uses net dopant density images, obtained on wafers via photoluminescence imagi

Description

Keywords

Citation

URI

http://hdl.handle.net/1885/24979

Collections

ANU Research Publications

Source

Journal of Crystal Growth

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

DOI

10.1016/j.jcrysgro.2012.11.056

Restricted until

2037-12-31

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01_Lim_Estimation_of_solidification_2013.pdf (1.3 MB)

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