Estimation of solidification interface shapes in a boron-phosphorus compensated multicrystalline silicon ingot via photoluminescence imaging
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Lim, Siew Yee
Forster, Maxime
MacDonald, Daniel
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Elsevier
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This paper introduces a method for estimating the shape of the solidification front along the height of a directionally-solidified multicrystalline silicon ingot. The technique uses net dopant density images, obtained on wafers via photoluminescence imagi
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Journal of Crystal Growth
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2037-12-31
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