Evaluation of the Bulk Lifetime of Silicon Wafers by Immersion in Hydrofluoric Acid and Illumination
| dc.contributor.author | Grant, Nicholas | |
| dc.contributor.author | McIntosh, Keith | |
| dc.contributor.author | Tan, Jason | |
| dc.date.accessioned | 2015-12-07T22:18:45Z | |
| dc.date.issued | 2012 | |
| dc.date.updated | 2015-12-07T08:25:17Z | |
| dc.description.abstract | We report on a procedure to temporarily attain a very high level of surface passivation for silicon wafers at room temperature. When applied during a photoconductance measurement, the procedure permits an accurate assessment of the bulk lifetime, even for | |
| dc.identifier.issn | 2162-8769 | |
| dc.identifier.uri | http://hdl.handle.net/1885/18973 | |
| dc.publisher | The Electrochemical Society | |
| dc.source | ECS Journal of Solid State Science and Technology | |
| dc.title | Evaluation of the Bulk Lifetime of Silicon Wafers by Immersion in Hydrofluoric Acid and Illumination | |
| dc.type | Journal article | |
| local.bibliographicCitation.issue | 2 | |
| local.bibliographicCitation.lastpage | 61 | |
| local.bibliographicCitation.startpage | 55 | |
| local.contributor.affiliation | Grant, Nicholas, College of Engineering and Computer Science, ANU | |
| local.contributor.affiliation | McIntosh, Keith, PV Lighthouse | |
| local.contributor.affiliation | Tan, Jason, College of Engineering and Computer Science, ANU | |
| local.contributor.authoruid | Grant, Nicholas, u4488538 | |
| local.contributor.authoruid | Tan, Jason, u4099750 | |
| local.description.embargo | 2037-12-31 | |
| local.description.notes | Imported from ARIES | |
| local.identifier.absfor | 090605 - Photodetectors, Optical Sensors and Solar Cells | |
| local.identifier.absseo | 850504 - Solar-Photovoltaic Energy | |
| local.identifier.ariespublication | u4552802xPUB6 | |
| local.identifier.citationvolume | 1 | |
| local.identifier.doi | 10.1149/2.003202jss | |
| local.identifier.scopusID | 2-s2.0-84884204789 | |
| local.identifier.thomsonID | 000319445100006 | |
| local.type.status | Published Version |
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