Holt, Stephen; Foran, Garry J; White, John
Clear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.
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