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Observation of hexagonal crystalline diffraction from growing silicate films

Holt, Stephen; Foran, Garry J; White, John

Description

Clear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.

CollectionsANU Research Publications
Date published: 1999
Type: Journal article
URI: http://hdl.handle.net/1885/93790
Source: Langmuir
DOI: 10.1021/la981390u

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