Skip navigation
Skip navigation

Observation of hexagonal crystalline diffraction from growing silicate films

Holt, Stephen; Foran, Garry J; White, John


Clear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.

CollectionsANU Research Publications
Date published: 1999
Type: Journal article
Source: Langmuir
DOI: 10.1021/la981390u


File Description SizeFormat Image
01_Holt_Observation_of_hexagonal_1999.pdf65.35 kBAdobe PDF    Request a copy

Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  23 August 2018/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator