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Very low bulk and surface recombination in oxidized silicon wafers

Kerr, Mark; Cuevas, Andres

Description

Bulk and surface processes determine the recombination rate in crystalline silicon wafers. In this paper we report effective lifetime measurements for a variety of commercially available float-zone silicon wafers that have been carefully passivated using

CollectionsANU Research Publications
Date published: 2002
Type: Journal article
URI: http://hdl.handle.net/1885/69975
Source: Semiconductor Science and Technology
DOI: 10.1088/0268-1242/17/1/306

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