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Measuring the Hardness of Silicon

dc.contributor.authorHaberl, Bianca
dc.contributor.authorBradby, Jodie
dc.contributor.authorWilliams, James
dc.coverage.spatialSydney Australia
dc.date.accessioned2015-12-10T22:56:58Z
dc.date.createdDecember 9-13 2012
dc.identifier.urihttp://hdl.handle.net/1885/60454
dc.publisherRMIT Publishing
dc.relation.ispartofseriesAustralian Institute of Physics Congress (AIP 2012)
dc.sourceProceedings of the 20th Australian Institute of Physics Congress
dc.source.urihttp://www.aip2012.org.au/
dc.titleMeasuring the Hardness of Silicon
dc.typeConference paper
local.description.notesImported from ARIES
local.description.refereedYes
dc.date.issued2012
local.identifier.absfor020406 - Surfaces and Structural Properties of Condensed Matter
local.identifier.ariespublicationU3594520xPUB541
local.type.statusPublished Version
local.contributor.affiliationHaberl, Bianca, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationBradby, Jodie, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationWilliams, James, College of Physical and Mathematical Sciences, ANU
local.description.embargo2037-12-31
local.bibliographicCitation.startpage1
local.identifier.absseo970102 - Expanding Knowledge in the Physical Sciences
dc.date.updated2015-12-10T07:57:38Z
CollectionsANU Research Publications

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