Measuring the Hardness of Silicon

dc.contributor.authorHaberl, Bianca
dc.contributor.authorBradby, Jodie
dc.contributor.authorWilliams, James
dc.coverage.spatialSydney Australia
dc.date.accessioned2015-12-10T22:56:58Z
dc.date.createdDecember 9-13 2012
dc.date.issued2012
dc.date.updated2015-12-10T07:57:38Z
dc.identifier.urihttp://hdl.handle.net/1885/60454
dc.publisherRMIT Publishing
dc.relation.ispartofseriesAustralian Institute of Physics Congress (AIP 2012)
dc.sourceProceedings of the 20th Australian Institute of Physics Congress
dc.source.urihttp://www.aip2012.org.au/
dc.titleMeasuring the Hardness of Silicon
dc.typeConference paper
local.bibliographicCitation.startpage1
local.contributor.affiliationHaberl, Bianca, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationBradby, Jodie, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationWilliams, James, College of Physical and Mathematical Sciences, ANU
local.contributor.authoremailu9908195@anu.edu.au
local.contributor.authoruidHaberl, Bianca, u4284509
local.contributor.authoruidBradby, Jodie, u9908195
local.contributor.authoruidWilliams, James, u8809701
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor020406 - Surfaces and Structural Properties of Condensed Matter
local.identifier.absseo970102 - Expanding Knowledge in the Physical Sciences
local.identifier.ariespublicationU3594520xPUB541
local.identifier.uidSubmittedByU3594520
local.type.statusPublished Version

Downloads

Original bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
01_Haberl_Measuring_the_Hardness_of_2012.pdf
Size:
67.52 KB
Format:
Adobe Portable Document Format