Measuring the Hardness of Silicon
dc.contributor.author | Haberl, Bianca | |
dc.contributor.author | Bradby, Jodie | |
dc.contributor.author | Williams, James | |
dc.coverage.spatial | Sydney Australia | |
dc.date.accessioned | 2015-12-10T22:56:58Z | |
dc.date.created | December 9-13 2012 | |
dc.date.issued | 2012 | |
dc.date.updated | 2015-12-10T07:57:38Z | |
dc.identifier.uri | http://hdl.handle.net/1885/60454 | |
dc.publisher | RMIT Publishing | |
dc.relation.ispartofseries | Australian Institute of Physics Congress (AIP 2012) | |
dc.source | Proceedings of the 20th Australian Institute of Physics Congress | |
dc.source.uri | http://www.aip2012.org.au/ | |
dc.title | Measuring the Hardness of Silicon | |
dc.type | Conference paper | |
local.bibliographicCitation.startpage | 1 | |
local.contributor.affiliation | Haberl, Bianca, College of Physical and Mathematical Sciences, ANU | |
local.contributor.affiliation | Bradby, Jodie, College of Physical and Mathematical Sciences, ANU | |
local.contributor.affiliation | Williams, James, College of Physical and Mathematical Sciences, ANU | |
local.contributor.authoremail | u9908195@anu.edu.au | |
local.contributor.authoruid | Haberl, Bianca, u4284509 | |
local.contributor.authoruid | Bradby, Jodie, u9908195 | |
local.contributor.authoruid | Williams, James, u8809701 | |
local.description.embargo | 2037-12-31 | |
local.description.notes | Imported from ARIES | |
local.description.refereed | Yes | |
local.identifier.absfor | 020406 - Surfaces and Structural Properties of Condensed Matter | |
local.identifier.absseo | 970102 - Expanding Knowledge in the Physical Sciences | |
local.identifier.ariespublication | U3594520xPUB541 | |
local.identifier.uidSubmittedBy | U3594520 | |
local.type.status | Published Version |
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