Estimation of solidification interface shapes in a boron-phosphorus compensated multicrystalline silicon ingot via photoluminescence imaging
Date
2013
Authors
Lim, Siew Yee
Forster, Maxime
MacDonald, Daniel
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
This paper introduces a method for estimating the shape of the solidification front along the height of a directionally-solidified multicrystalline silicon ingot. The technique uses net dopant density images, obtained on wafers via photoluminescence imagi
Description
Keywords
Citation
Collections
Source
Journal of Crystal Growth
Type
Journal article
Book Title
Entity type
Access Statement
License Rights
Restricted until
2037-12-31
Downloads
File
Description