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Estimation of solidification interface shapes in a boron-phosphorus compensated multicrystalline silicon ingot via photoluminescence imaging

Lim, Siew Yee; Forster, Maxime; MacDonald, Daniel

Description

This paper introduces a method for estimating the shape of the solidification front along the height of a directionally-solidified multicrystalline silicon ingot. The technique uses net dopant density images, obtained on wafers via photoluminescence imagi

CollectionsANU Research Publications
Date published: 2013
Type: Journal article
URI: http://hdl.handle.net/1885/24979
Source: Journal of Crystal Growth
DOI: 10.1016/j.jcrysgro.2012.11.056

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