Series Resistance as a Function of Current and its Application in Solar Cell Analysis
Date
2011
Authors
Fong, Kean
McIntosh, Keith
Franklin, Evan
Blakers, Andrew
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Electrical and Electronics Engineers (IEEE Inc)
Abstract
The series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract Rs-light and Rs-dark as a function of current. Application of Rs(J) to analysis of solar cell is demonstrated by extracting the Rs-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic Rs effects. Since the Rs(J) and Rs-corrected J-V data is measured in high detail, the total losses from the Rs and the pseudo efficiency can be measured without need of curve fitting. Finally, by including Rs(J) to the modelling of solar cells, errors in parameterization caused by variation in Rs value is eliminated.
Description
Keywords
Keywords: Cell analysis; Operating condition; P-n junction; Photovoltaic; Series resistances; Solar cell characterization; Total loss; Curve fitting; Photovoltaic effects; Semiconductor junctions; Electric resistance
Citation
Collections
Source
Proceedings of IEEE Photovoltaic Specialists Conference (PVSC 2011)
Type
Conference paper
Book Title
Entity type
Access Statement
License Rights
Restricted until
2037-12-31
Downloads
File
Description