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Light ion induced damage in CdTe and Hg(1 - X)Cd(x)Te epitaxial thin films

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dc.contributor.authorRusso, S. P.en
dc.contributor.authorJohnston, P. N.en
dc.contributor.authorElliman, R. G.en
dc.contributor.authorJamieson, D. N.en
dc.date.accessioned2026-01-01T15:42:11Z
dc.date.available2026-01-01T15:42:11Z
dc.date.issued1996en
dc.description.abstractThe effect of variation of MCT stoichiometry (x) on the damage induced by 2 MeV He ions has been measured by the comparison of damage accumulation in Hg0.48Cd0.52Te (MCT, x ≅ 0.52) and CdTe (MCT, x 1). The comparison of damage induced by irradiation in the random and channeled directions for MCT (x = 0.52) by 2 MeV He ions has also been measured. The results extend earlier work on light ion damage induced in MCT epitaxial thin films.en
dc.description.statusPeer-revieweden
dc.format.extent5en
dc.identifier.issn0168-583Xen
dc.identifier.otherORCID:/0000-0002-1304-4219/work/167651069en
dc.identifier.scopus0030173305en
dc.identifier.urihttps://hdl.handle.net/1885/733801394
dc.language.isoenen
dc.sourceNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atomsen
dc.titleLight ion induced damage in CdTe and Hg(1 - X)Cd(x)Te epitaxial thin filmsen
dc.typeJournal articleen
dspace.entity.typePublicationen
local.bibliographicCitation.lastpage222en
local.bibliographicCitation.startpage218en
local.contributor.affiliationRusso, S. P.; Royal Melbourne Institute of Technology Universityen
local.contributor.affiliationJohnston, P. N.; Royal Melbourne Institute of Technology Universityen
local.contributor.affiliationElliman, R. G.; Department of Electronic Materials Engineering, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.contributor.affiliationJamieson, D. N.; University of Melbourneen
local.identifier.citationvolume113en
local.identifier.doi10.1016/0168-583X(95)01373-3en
local.identifier.puree07be6c8-e82c-4b77-8f49-e3bdc4993164en
local.identifier.urlhttps://www.scopus.com/pages/publications/0030173305en
local.type.statusPublisheden

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